Development and Application of Image Analysis Methods to Characterize Structures of C-Pd Layers

Development and Application of Image Analysis Methods to Characterize Structures of C-Pd Layers
Elżbieta Zając
The Faculty of Mathematics and Natural Science, The Jan Kochanowski University in Kielce, Świętokrzyska 15, 25-406 Kielce
Corresponding author: elzbieta.zajac (at) ujk.edu.pl

Scanning Electron Microscopy (SEM) and image analysis techniques are powerful tools for investigating the structure of nanomaterials. There is a lot of commercial and non-commercial software used to identify, count, measure and classify objects represented in SEM images. Nevertheless in some special cases, like in the case of SEM images of C-Pd nanolayers, the commonly used tools and methods are not satisfactory.
We apply some well known and some new methods to analyze the quantity and topography structure of palladium nanograins embedded in carbonaceus matrix. New algorithms and methods were developed to improve the results of identification and measurement of palladium nanograins. Graph theory algorithms and some statistical methods were used to describe the topography of C-Pd nanolayers.

http://wilga.ise.pw.edu.pl/sites/wilga.ise.pw.edu.pl/files/Abstrakt -Zając.pdf

Author: dr E.Zając
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